System-wide Balanced Solutions
Ensuring exact results of hundreds, if not thousands, of complex RF measurements during each series of test sequences, Auriga's automated test systems balance technical requirements with everyday business demands.
Auriga Custom Test System (CTS-3)
A turn-key, fully-automated, component test system that radically changes the dynamics of complex, RF measurements.
Incorporating Auriga’s proprietary hardware and core-software, with the latest in 3rd party measurement hardware, we deliver unmatched speed and accuracy when taking RF measurements.
CTS-3, our 3rd generation custom test system, a turn-key, fully-automated, component test system, provides a single-connection, multiple-measurement architecture used in both low-volume and high-volume manufacturing of: high-frequency commercial and military modules and MMIC devices, such as transmit and receive modules (T/R); LMDS and MMDS CPE; and Base Station testing.
CTS-3 systems are used in:
-
Research and development - CTS-3 performs precise electrical measurements on increasingly complex and high-speed chips in order to assure quality and reliability, reduce costly redesigns, accelerate time-to-market, and improve chip fabrication processes
-
Manufacturing - As production test systems, CTS-3 reduces manufacturing costs of complex and high-speed chips by supporting the identification of defective chips and modules early in the production process
The following is an example of the performance increase from our CTS-2 to CTS-3 system:
| CTS-2 | CTS-3 | |||||||
| Freqs | Powers | States | Total | Point time |
Total time |
Point time |
Total time |
|
| S-parameters | 3 | 41 | 16 | 1968 | 0.25 | 492 | 0.001 | 1.968 |
| Noise Figure | 3 | 1 | 16 | 48 | 3 | 144 | 0.066 | 3.168 |
| TOI | 3 | 1 | 1 | 3 | 0.1 | 0.3 | 0.008 | 0.024 |
| Harmonics | 3 | 1 | 1 | 3 | 0.05 | 0.15 | 0.004 | 0.012 |
| Total test time in seconds: | 636.45 | 5.172 | ||||||
Measurement Science Expertise
Auriga’s ATE team, a team specifically dedicated to delivering custom test systems, has more than 100 years of combined RF microwave ATE experience, and capable of solving even the most difficult measurement problems. We focus specifically on the device characterization marketplace, and offer a full spectrum of solutions to meet our customers’ demanding requirements. The team’s reputation is second to none in the field and brings world-class experience to bear on any project.
Customized
- Optimized system configuration
- Software development
- Fixturing
Services
- Build-to-print Rack and Stack
- System upgrades
- ATE consulting
- Test and Measurement user training
- Yearly support and service contracts